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Cleaning technology for highly reliable gate oxides
Publication:
Cleaning technology for highly reliable gate oxides
Date
1994
Proceedings Paper
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190.pdf
870.86 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Heyns, Marc
;
Meuris, Marc
;
Verhaverbeke, Steven
;
Mertens, Paul
;
Schmidt, Harald
;
Rotondaro, Antonio
;
Hurd, Trace
;
Hatcher, Z.
;
Gräf, D.
Journal
Abstract
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2075
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2075
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations