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Factor analysis of plasma-induced damage in bulk FinFET technology
Publication:
Factor analysis of plasma-induced damage in bulk FinFET technology
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hiblot, Gaspard
;
Van der Plas, Geert
Journal
IEEE Electron Device Letters
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1938
since deposited on 2021-10-25
1
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1938
since deposited on 2021-10-25
1
last month
Acq. date: 2025-12-15
Citations