Publication:

Low-frequency noise assessment of different Ge pFinFET STI processes

Date

2016

Journal article

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Author(s)

Oliveira, Alberto

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;

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Agopian, Gaula G.D.

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Martino, Joao Antonio

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;

Witters, Liesbeth

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Collaert, Nadine

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Journal

IEEE Transactions on Electron Devices

Metrics

1924 since deposited on 2021-10-23

Acq. date: 2025-12-11