Publication:

Total-dose effects caused by high-energy neutrons and gamma-rays in multiple-gate FETs

Date

2010
Journal article
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dc.contributor.authorKilchytska, V.
dc.contributor.authorAlvarado, J.
dc.contributor.authorCollaert, Nadine
dc.contributor.authorRooyackers, Rita
dc.contributor.authorMilitaru, O.
dc.contributor.authorBerger, G.
dc.contributor.authorFlandre, D.
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-18T17:37:23Z
dc.date.available2021-10-18T17:37:23Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17367
dc.source.beginpage1764
dc.source.endpage1770
dc.source.issue4
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.volume57
dc.title

Total-dose effects caused by high-energy neutrons and gamma-rays in multiple-gate FETs

dc.typeJournal article
dspace.entity.typePublication
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