Publication:

Wafer level electrical evaluation of vertical carbon nanotube bundles as a function of the growth temperature

Date

2013
Journal article
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dc.contributor.authorVereecke, Bart
dc.contributor.authorvan der Veen, Marleen
dc.contributor.authorSugiura, Masahito
dc.contributor.authorKashiwagi, Yusaku
dc.contributor.authorKe, Xiaoxing
dc.contributor.authorCott, Daire
dc.contributor.authorHantschel, Thomas
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorTokei, Zsolt
dc.contributor.imecauthorVereecke, Bart
dc.contributor.imecauthorvan der Veen, Marleen
dc.contributor.imecauthorCott, Daire
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.orcidimecvan der Veen, Marleen::0000-0002-9402-8922
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.date.accessioned2021-10-21T14:04:42Z
dc.date.available2021-10-21T14:04:42Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.issn0021-4922
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23330
dc.identifier.urlhttp://jjap.jsap.jp/link?JJAP/52/04CN02/
dc.source.beginpage04CN02
dc.source.issue4
dc.source.journalJapanese Journal of Applied Physics
dc.source.volume52
dc.title

Wafer level electrical evaluation of vertical carbon nanotube bundles as a function of the growth temperature

dc.typeJournal article
dspace.entity.typePublication
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