Publication:
Depth Resolution and Ripple Formation on AlxGa 1-xAs
Date
| dc.contributor.author | Elst, Kathy | |
| dc.contributor.author | Tian, Chunsheng | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.author | Adams, F. | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-09-29T13:06:15Z | |
| dc.date.available | 2021-09-29T13:06:15Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/642 | |
| dc.source.conference | 10th International Conference on Secondary Ion Mass Spectrometry (SIMS X); October 1-6, 1995; Münster, Germany. | |
| dc.source.conferencelocation | ||
| dc.title | Depth Resolution and Ripple Formation on AlxGa 1-xAs | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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