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Damage layer in silica-based low-k material induced by the patterning plasma process studied by energy-filtered TEM
Publication:
Damage layer in silica-based low-k material induced by the patterning plasma process studied by energy-filtered TEM
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Date
2005-04
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Richard, Olivier
;
Iacopi, Francesca
;
Tokei, Zsolt
;
Bender, Hugo
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1881
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Acq. date: 2025-12-15
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Metrics
Views
1881
since deposited on 2021-10-16
2
last month
1
last week
Acq. date: 2025-12-15
Citations