Publication:

Damage layer in silica-based low-k material induced by the patterning plasma process studied by energy-filtered TEM

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1881 since deposited on 2021-10-16
2last month
1last week
Acq. date: 2025-12-15

Citations

Metrics

Views

1881 since deposited on 2021-10-16
2last month
1last week
Acq. date: 2025-12-15

Citations