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Test challenges for 3D-SICs: all the old, most of the recent, and then some new!
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Test challenges for 3D-SICs: all the old, most of the recent, and then some new!
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
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1779
since deposited on 2021-10-18
Acq. date: 2025-12-15
Citations
Metrics
Views
1779
since deposited on 2021-10-18
Acq. date: 2025-12-15
Citations