Publication:

Evaluation of electron irradiated SiGe/Si diodes by Raman spectroscopy

Date

2010
Meeting abstract
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dc.contributor.authorTsunoda, I.
dc.contributor.authorNaka, N.
dc.contributor.authorTakakura, K.
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorOhyama, Hidenori
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-18T22:29:59Z
dc.date.available2021-10-18T22:29:59Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18106
dc.source.conference9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications - RASEDA
dc.source.conferencedate27/10/2010
dc.source.conferencelocationTakasaki Gunma Japan
dc.title

Evaluation of electron irradiated SiGe/Si diodes by Raman spectroscopy

dc.typeMeeting abstract
dspace.entity.typePublication
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