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Negative bias temperature instability in devices with millisecond annealed ultra-shallow junctions
Publication:
Negative bias temperature instability in devices with millisecond annealed ultra-shallow junctions
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Date
2013
Proceedings Paper
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27623.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Moras, Miquel
;
Martin-Martinez, Javier
;
Rodriguez, Rosanna
;
Nafria, Montse
;
Aymerich, Xavier
;
Simoen, Eddy
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1951
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Acq. date: 2025-12-09
Citations
Metrics
Views
1951
since deposited on 2021-10-21
2
last month
1
last week
Acq. date: 2025-12-09
Citations