Publication:

Negative bias temperature instability in devices with millisecond annealed ultra-shallow junctions

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1948 since deposited on 2021-10-21
Acq. date: 2025-10-26

Citations

Metrics

Views

1948 since deposited on 2021-10-21
Acq. date: 2025-10-26

Citations