Publication:

Evaluation of trap creation and charging in thin SiO2 using both SCM and C-AFM

Date

 
dc.contributor.authorPolspoel, Wouter
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorVandervorst, Wilfried
dc.date.accessioned2021-10-16T18:44:41Z
dc.date.available2021-10-16T18:44:41Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12726
dc.source.beginpage495
dc.source.endpage500
dc.source.issue3
dc.source.journalMicroelectronic Engineering
dc.source.volume84
dc.title

Evaluation of trap creation and charging in thin SiO2 using both SCM and C-AFM

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections: