Publication:

Accurate micro Hall effect measurement on scribe line pads

Date

2009
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorOsterberg, Frederik
dc.contributor.authorPetersen, Dirch
dc.contributor.authorWang, Fei
dc.contributor.authorRosseel, Erik
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorHansen, Ole
dc.contributor.imecauthorRosseel, Erik
dc.contributor.imecauthorVandervorst, Wilfried
dc.date.accessioned2021-10-18T01:21:43Z
dc.date.available2021-10-18T01:21:43Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15957
dc.source.conference17th Annual IEEE International Conference on Advanced Thermal Processing of Semiconductors - RTP
dc.source.conferencedate29/09/2009
dc.source.conferencelocationAlbany, NY USA
dc.title

Accurate micro Hall effect measurement on scribe line pads

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions