Publication:

Impact of device architecture and gate stack processing on the low-frequency noise of silicon nanowire transistors

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1851 since deposited on 2021-10-27
4last month
3last week
Acq. date: 2026-08-06

Citations

Statistics

Views

1851 since deposited on 2021-10-27
4last month
3last week
Acq. date: 2026-08-06

Citations