Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications

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Author(s)

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Nicoletti, Talitha

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Almeida, Luciano

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Dos Santos, Sara

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Nissimoff, Albert

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Aoulaiche, Marc

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Journal

Solid-State Electronics

Metrics

1906 since deposited on 2021-10-22

Acq. date: 2025-10-24