Impact of the substrate quality on the low frequency noise of silicon diodes

dc.contributor.author	Simoen, Eddy
dc.contributor.author	Bosman, Gijs
dc.contributor.author	Vanhellemont, Jan
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-09-29T15:24:55Z
dc.date.available	2021-09-29T15:24:55Z
dc.date.issued	1996
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1480
dc.source.beginpage	96
dc.source.conference	6th Quantum 1/f Noise and Other Low frequency Fluctuations in Electronic Devices Symposium
dc.source.conferencedate	27/05/1994
dc.source.conferencelocation	St. Louis, MO USA
dc.source.endpage	104
dc.title	Impact of the substrate quality on the low frequency noise of silicon diodes
dc.type	Proceedings paper
dspace.entity.type	Publication
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