Publication:

Two dimensional electrical characterization of semiconductor devices under high vacuum conditions

Date

2007
Meeting abstract
Simple item page Full metadata Statistics
 
dc.contributor.authorEyben, Pierre
dc.contributor.authorPolspoel, Wouter
dc.contributor.authorMody, Jay
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.date.accessioned2021-10-16T16:04:16Z
dc.date.available2021-10-16T16:04:16Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12140
dc.source.conferenceSPM Day
dc.source.conferencedate16/11/2007
dc.source.conferencelocationLeiden The Netherlands
dc.title

Two dimensional electrical characterization of semiconductor devices under high vacuum conditions

dc.typeMeeting abstract
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions