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Probabilistic defect occupancy model for NBTI
Publication:
Probabilistic defect occupancy model for NBTI
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Date
2011-04
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martin-Martinez, Javier
;
Kaczer, Ben
;
Toledano Luque, Maria
;
Rodriguez, Rosana
;
Nafria, Monserat
;
Aymerich, X.
;
Groeseneken, Guido
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1954
since deposited on 2021-10-19
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Acq. date: 2025-12-10
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Metrics
Views
1954
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-10
Citations