Publication:
Surface characterization using TIRF microscopy
Date
| dc.contributor.author | Thoelen, R. | |
| dc.contributor.author | Daenen, M. | |
| dc.contributor.author | Williams, O.A. | |
| dc.contributor.author | Vermeeren, V. | |
| dc.contributor.author | Gielen, E. | |
| dc.contributor.author | Hellings, N. | |
| dc.contributor.author | Haenen, Ken | |
| dc.contributor.author | Manca, Jean | |
| dc.contributor.author | Wagner, P. | |
| dc.contributor.author | Ameloot, M. | |
| dc.contributor.author | Michiels, L. | |
| dc.contributor.author | vandeVen, M. | |
| dc.contributor.imecauthor | Haenen, Ken | |
| dc.contributor.orcidimec | Haenen, Ken::0000-0001-6711-7367 | |
| dc.date.accessioned | 2021-10-16T05:39:19Z | |
| dc.date.available | 2021-10-16T05:39:19Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11309 | |
| dc.source.conference | Surface and Bulk Defects in CVD Diamond Films X | |
| dc.source.conferencedate | 23/02/2005 | |
| dc.source.conferencelocation | Diepenbeek Belgium | |
| dc.title | Surface characterization using TIRF microscopy | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |