Publication:

Interface trap states induced underestimation of Schottky barrier height in metal-MX2 junctions

Date

2025-JUL 1
Journal article
https://doi.org/10.1038/s41699-025-00576-y
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dc.contributor.authorJawa, Himani
dc.contributor.authorVerreck, Devin
dc.contributor.authorSun, Zheng
dc.contributor.authorSutar, Surajit
dc.contributor.authorLockhart de la Rosa, Cesar Javier
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorAppenzeller, Joerg
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorSutar, Surajit
dc.contributor.imecauthorde la Rosa, Cesar Javier Lockhart
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecSutar, Surajit::0000-0003-3114-718X
dc.date.accessioned2025-07-11T03:55:45Z
dc.date.available2025-07-11T03:55:45Z
dc.date.issued2025-JUL 1
dc.description.wosFundingTextH.J., Z.S., and J.A. acknowledge the joint MOU between the Indiana Economic Development Corporation, Purdue University, and imec, with in-kind support from the Applied Research Institute. D.V., S.S., C.J.L.R., and G.S.K. acknowledge imec's Industrial Affiliation program for exploratory logic.
dc.identifier.doi10.1038/s41699-025-00576-y
dc.identifier.issn2379-7132
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45891
dc.publisherNATURE PORTFOLIO
dc.source.beginpage55
dc.source.issue1
dc.source.journalNPJ 2D MATERIALS AND APPLICATIONS
dc.source.numberofpages5
dc.source.volume9
dc.subject.keywordsMOS2
dc.subject.keywordsMONOLAYER
dc.title

Interface trap states induced underestimation of Schottky barrier height in metal-MX2 junctions

dc.typeJournal article
dspace.entity.typePublication
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