Publication:

Induced variability of cell-to-cell interference by line edge roughness in nand flash arrays

Date

2012
Journal article
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dc.contributor.authorPoliakov, Pavel
dc.contributor.authorBlomme, Pieter
dc.contributor.authorVaglio Pret, Alessandro
dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorGronheid, Roel
dc.contributor.authorVerkest, Diederik
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorDehaene, Wim
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorVaglio Pret, Alessandro
dc.contributor.imecauthorGronheid, Roel
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-20T14:41:37Z
dc.date.available2021-10-20T14:41:37Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21317
dc.source.beginpage164
dc.source.endpage166
dc.source.issue2
dc.source.journalIEEE Electron Device Letters
dc.source.volume33
dc.title

Induced variability of cell-to-cell interference by line edge roughness in nand flash arrays

dc.typeJournal article
dspace.entity.typePublication
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