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Toward a streamlined projection of small device BTI lifetime distributions

Date

2013
Journal article
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dc.contributor.authorToledano Luque, Maria
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.contributor.authorRoussel, Philippe
dc.contributor.authorFranco, Jacopo
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.date.accessioned2021-10-21T12:48:34Z
dc.date.available2021-10-21T12:48:34Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.issn1071-1023
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23177
dc.source.beginpage01A114
dc.source.issue1
dc.source.journalJournal of Vacuum Science and Technology B
dc.source.volume31
dc.title

Toward a streamlined projection of small device BTI lifetime distributions

dc.typeJournal article
dspace.entity.typePublication
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