Publication:

Epitaxial laterial overgrowth of GaN on sapphire. An examination of epitaxy quality using synchrotron X-ray topography

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1942 since deposited on 2021-10-14
Acq. date: 2026-01-27

Citations

Statistics

Views

1942 since deposited on 2021-10-14
Acq. date: 2026-01-27

Citations