Publication:
Epitaxial laterial overgrowth of GaN on sapphire. An examination of epitaxy quality using synchrotron X-ray topography
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1942 since deposited on 2021-10-14
1last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1942 since deposited on 2021-10-14
1last month
Acq. date: 2025-12-08
Citations