Publication:

Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level

Date

2023
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorRanjbar, Behnaz
dc.contributor.authorKlemme, Florian
dc.contributor.authorGenssler, Paul R.
dc.contributor.authorAmrouch, Hussam
dc.contributor.authorJung, Jinhyo
dc.contributor.authorDave, Shail
dc.contributor.authorSo, Hwisoo
dc.contributor.authorLee, Kyongwoo
dc.contributor.authorShrivastava, Aviral
dc.contributor.authorLin, Ji-Yung
dc.contributor.authorWeckx, Pieter
dc.contributor.authorMishra, Subrat
dc.contributor.authorCatthoor, Francky
dc.contributor.authorBiswas, Dwaipayan
dc.contributor.authorKumar, Akash
dc.contributor.imecauthorLin, Ji-Yung
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorMishra, Subrat
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorBiswas, Dwaipayan
dc.contributor.orcidimecLin, Ji-Yung::0000-0001-9119-6069
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecMishra, Subrat::0000-0002-1435-3275
dc.contributor.orcidimecBiswas, Dwaipayan::0000-0002-1087-3433
dc.date.accessioned2024-03-25T15:33:17Z
dc.date.available2023-08-19T18:10:06Z
dc.date.available2023-08-21T07:43:09Z
dc.date.available2024-03-25T15:33:17Z
dc.date.issued2023
dc.description.wosFundingTextThis research was supported in part by 1) Advantest as part of the Graduate School "Intelligent Methods for Test and Reliability" (GS-IMTR) at the University of Stuttgart; 2) funding from National Science Foundation Grants No. CPS 1646235, CCF 1723476 - the NSF/Intel joint research center for Computer Assisted Programming for Heterogeneous Architectures (CAPA) at Arizona State University; 3) National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. RS-2022-00165225) at Yonsei University; 4) German Research Foundation (DFG) within the Cluster of Excellence Center for Advancing Electronics Dresden (CFAED) at the Technische Universitat Dresden.
dc.identifier.eisbn979-8-3503-9624-9
dc.identifier.issn1530-1591
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42363
dc.publisherIEEE
dc.source.conferenceDesign, Automation and Test in Europe Conference and Exhibition (DATE)
dc.source.conferencedateAPR 17-19, 2023
dc.source.conferencelocationAntwerp
dc.source.journalN/A
dc.source.numberofpages10
dc.subject.keywordsreliability
dc.subject.keywordsmachine learning
dc.subject.keywordsaging
dc.subject.keywordstask scheduling
dc.subject.keywordserror mitigation
dc.title

Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions