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Extended-defect aspects on Ge-on-Si materials and devices
Publication:
Extended-defect aspects on Ge-on-Si materials and devices
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Date
2009
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Eneman, Geert
;
Wang, Gang
;
Souriau, Laurent
;
Loo, Roger
;
Caymax, Matty
;
Claeys, Cor
Journal
Journal of the Electrochemical Society
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1921
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Acq. date: 2025-12-15
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Views
1921
since deposited on 2021-10-18
2
last month
1
last week
Acq. date: 2025-12-15
Citations