Publication:

SiGe band-to-band tunneling calibration based on p-i-n diodes: fabrication, measurement and simulation

Date

2012
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorKao, Frank
dc.contributor.authorVerhulst, Anne
dc.contributor.authorRooyackers, Rita
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorSimoen, Eddy
dc.contributor.authorArstila, Kai
dc.contributor.authorDouhard, Bastien
dc.contributor.authorLoo, Roger
dc.contributor.authorMilenin, Alexey
dc.contributor.authorTolle, J.
dc.contributor.authorDekkers, Harold
dc.contributor.authorMachkaoutsan, Vladimir
dc.contributor.authorMaes, Jan
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHeyns, Marc
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorKao, Frank
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDouhard, Bastien
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorMilenin, Alexey
dc.contributor.imecauthorDekkers, Harold
dc.contributor.imecauthorMachkaoutsan, Vladimir
dc.contributor.imecauthorMaes, Jan
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecMilenin, Alexey::0000-0003-0747-0462
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.date.accessioned2021-10-20T12:04:49Z
dc.date.available2021-10-20T12:04:49Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20901
dc.source.beginpage965
dc.source.conferenceSiGe, Ge, and Related Compunds 5: Materials, Processing, and Devices
dc.source.conferencedate7/10/2012
dc.source.conferencelocationHonolulu, HI USA
dc.source.endpage970
dc.title

SiGe band-to-band tunneling calibration based on p-i-n diodes: fabrication, measurement and simulation

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
25640.pdf
Size:
219.5 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions