Publication:
High-throughput process chain for single electron transistor devices based on field-emission scanning probe lithography and Smart Nanoimprint technology
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1999 since deposited on 2021-10-27
Acq. date: 2025-12-10
Citations
Metrics
Views
1999 since deposited on 2021-10-27
Acq. date: 2025-12-10
Citations