HBM ESD robustness of GaN-on-Si Schottky diodes for power applications

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Author(s)

Chen, Shih-Hung

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Griffoni, Alessio

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Srivastava, Puneet

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Linten, Dimitri

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;

;

;

Vashchenko, Vladislav

;

Gallerano, Antonio

;

Lafonteese, David

;

;

Van Hove, Marleen

;

Decoutere, Stefaan

;

Groeseneken, Guido

Metrics

1960 since deposited on 2021-10-19

Acq. date: 2025-10-24