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Conference contributions
Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis
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Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hoenicke, Philipp
;
Mueller, Matthias
;
Detlefs, Blanka
;
Fleischmann, Claudia
;
Beckhoff, Burkhard
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Abstract
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1883
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations
Metrics
Views
1883
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations