Breakdown and recovery of thin gate oxides

dc.contributor.author	Bearda, Twan
dc.contributor.author	Mertens, Paul
dc.contributor.author	Heyns, Marc
dc.contributor.author	Woerlee, P.
dc.contributor.author	Wallinga, H.
dc.contributor.imecauthor	Mertens, Paul
dc.contributor.imecauthor	Heyns, Marc
dc.date.accessioned	2021-10-14T12:40:25Z
dc.date.available	2021-10-14T12:40:25Z
dc.date.embargo	9999-12-31
dc.date.issued	2000
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/4100
dc.source.beginpage	116
dc.source.conference	Proceedings of the 30th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate	11/09/2000
dc.source.conferencelocation	Cork Ireland
dc.source.endpage	119
dc.title	Breakdown and recovery of thin gate oxides
dc.type	Proceedings paper
dspace.entity.type	Publication
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