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Advantage of NW structure in preservation of SRB-induced strain and investigation of off-state leakage in strained stacked Ge NW pFET
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Advantage of NW structure in preservation of SRB-induced strain and investigation of off-state leakage in strained stacked Ge NW pFET
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Date
2018
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Arimura, Hiroaki
;
Eneman, Geert
;
Capogreco, Elena
;
Witters, Liesbeth
;
De Keersgieter, An
;
Favia, Paola
;
Porret, Clément
;
Hikavyy, Andriy
;
Loo, Roger
;
Bender, Hugo
;
Ragnarsson, Lars-Ake
;
Mitard, Jerome
;
Collaert, Nadine
;
Mocuta, Dan
;
Horiguchi, Naoto
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1942
since deposited on 2021-10-25
2
last month
Acq. date: 2026-01-11
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Views
1942
since deposited on 2021-10-25
2
last month
Acq. date: 2026-01-11
Citations