Publication:
Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: electrical characterization and modeling
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1856 since deposited on 2021-10-16
2last month
Acq. date: 2026-01-07
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Metrics
Views
1856 since deposited on 2021-10-16
2last month
Acq. date: 2026-01-07
Citations