Publication:
Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors
| dc.contributor.author | Ravsher, Taras | |
| dc.contributor.author | Fantini, Andrea | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Houshmand Sharifi, Shamin | |
| dc.contributor.author | Hody, Hubert | |
| dc.contributor.author | Dekkers, Harold | |
| dc.contributor.author | Witters, Thomas | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.author | Afanas'ev, Valeri | |
| dc.contributor.author | Couet, Sebastien | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.imecauthor | Ravsher, Taras | |
| dc.contributor.imecauthor | Fantini, Andrea | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Houshmand Sharifi, Shamin | |
| dc.contributor.imecauthor | Hody, Hubert | |
| dc.contributor.imecauthor | Dekkers, Harold | |
| dc.contributor.imecauthor | Witters, Thomas | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.imecauthor | Couet, Sebastien | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.orcidimec | Ravsher, Taras::0000-0001-7862-5973 | |
| dc.contributor.orcidimec | Fantini, Andrea::0000-0002-3220-8856 | |
| dc.contributor.orcidimec | Dekkers, Harold::0000-0003-4778-5709 | |
| dc.contributor.orcidimec | Witters, Thomas::0000-0002-8528-9469 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.contributor.orcidimec | Couet, Sebastien::0000-0001-6436-9593 | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.contributor.orcidimec | Houshmand Sharifi, Shamin::0000-0002-0989-0666 | |
| dc.contributor.orcidimec | Hody, Hubert::0009-0000-1407-8755 | |
| dc.date.accessioned | 2023-04-28T07:27:05Z | |
| dc.date.available | 2023-02-27T03:28:18Z | |
| dc.date.available | 2023-04-28T07:27:05Z | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This work was performed as part of imec's industrial affiliation program on MRAM devices. T.R. thanks FWO Research Foundation Flanders for the funding (grant no 1SD4721). | |
| dc.identifier.doi | 10.1109/IRPS48227.2022.9764424 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41172 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.journal | na | |
| dc.source.numberofpages | 5 | |
| dc.title | Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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