Publication:
Evidence for source-side injection hot carrier effects on lateral DMOS transistors
Date
| dc.contributor.author | Aresu, S. | |
| dc.contributor.author | De Ceuninck, Ward | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Moens, P. | |
| dc.contributor.author | Manca, Jean | |
| dc.contributor.author | Wojciechowski, D. | |
| dc.contributor.author | Gassot, P. | |
| dc.contributor.imecauthor | De Ceuninck, Ward | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | De Ceuninck, Ward::0000-0002-4630-5569 | |
| dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
| dc.date.accessioned | 2021-10-15T12:39:01Z | |
| dc.date.available | 2021-10-15T12:39:01Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8481 | |
| dc.source.beginpage | 1621 | |
| dc.source.conference | Proceedings of the 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF | |
| dc.source.conferencedate | 4/10/2004 | |
| dc.source.conferencelocation | Zürich Switzerland | |
| dc.source.endpage | 1624 | |
| dc.title | Evidence for source-side injection hot carrier effects on lateral DMOS transistors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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