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Reliability of RF-MEMS: stress relaxation in Al-alloy films
Publication:
Reliability of RF-MEMS: stress relaxation in Al-alloy films
Date
2003
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Modlinski, Robert
;
Chen, Q.
;
Witvrouw, Ann
;
Ratchev, Petar
;
Puers, Bob
;
den Toonder, J.M.J.
;
De Wolf, Ingrid
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Abstract
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1936
since deposited on 2021-10-15
417
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1936
since deposited on 2021-10-15
417
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations