Publication:
Impact of duty factor, stress stimuli, and gate drive strength on gate delay degradation with an atomistic trap-based BTI model
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1871 since deposited on 2021-10-20
1last month
Acq. date: 2026-04-07
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1871 since deposited on 2021-10-20
1last month
Acq. date: 2026-04-07
Citations