Publication:
Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise
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1987 since deposited on 2021-10-20
1last month
Acq. date: 2026-01-09
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Metrics
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1987 since deposited on 2021-10-20
1last month
Acq. date: 2026-01-09
Citations