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Processing Induced Changes of Mechanical Stresses in and near Cu Through Silicon Vias (TSVs): A Finite Element Modelling Study
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Processing Induced Changes of Mechanical Stresses in and near Cu Through Silicon Vias (TSVs): A Finite Element Modelling Study
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2017-12
Dissertation
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43167.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nabiollahi, Nabi
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1
since deposited on 2021-10-24
Acq. date: 2025-12-13
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1975
since deposited on 2021-10-24
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last month
Acq. date: 2025-12-13
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Downloads
1
since deposited on 2021-10-24
Acq. date: 2025-12-13
Views
1975
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-13
Citations