Publication:

Tin doping effects in silicon

Date

2000
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorNeimash, V. B.
dc.contributor.authorKraitchinskii, A.
dc.contributor.authorKras'ko, M.
dc.contributor.authorPuzenko, O.
dc.contributor.authorBlondeel, A.
dc.contributor.authorClauws, P.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-14T13:47:21Z
dc.date.available2021-10-14T13:47:21Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4749
dc.source.beginpage223
dc.source.conferenceHigh Purity Silicon VI
dc.source.conferencedate22/10/2000
dc.source.conferencelocationPhoenix, AZ USA
dc.source.endpage235
dc.title

Tin doping effects in silicon

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
4750.pdf
Size:
1.86 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions