Publication:

On the impact of the gate work-function metal on the charge trapping component of NBTI and PBTI

Date

2019

Journal article

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Files

44631.pdf 1.66 MB

Author(s)

;

;

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Ragnarsson, Lars-Ake

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Dekkers, Harold

;

Vandooren, Anne

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Groeseneken, Guido

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Horiguchi, Naoto

;

Collaert, Nadine

;

Linten, Dimitri

;

;

Journal

IEEE Transactions on Device and Materials Reliability

Statistics

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Acq. date: 2026-08-10