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Optimization of EUV reticle cleaning by evaluation of chemistries on wafer-based mimic test structures.
Publication:
Optimization of EUV reticle cleaning by evaluation of chemistries on wafer-based mimic test structures.
Date
2016
Proceedings Paper
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34674.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pacco, Antoine
;
Dattilo, Davide
;
Jonckheere, Rik
;
Rip, Jens
;
Dietze, Uwe
;
Kruemberg, Jens
;
Holsteyns, Frank
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1844
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations
Metrics
Views
1844
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations