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Temperature Dependence of AlGaN/GaN High Electron Mobility Transistors on 200 mm Si wafers

 
dc.contributor.authorBaptista Junior, Braz
dc.contributor.authorCano de Andrade, Maria Gloria
dc.contributor.authorde Oliveira Bergamim, Luis Felipe
dc.contributor.authorNogueira, Carlos Roberto
dc.contributor.authorAbud, Renan Baptista
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2023-06-13T09:11:11Z
dc.date.available2023-02-27T03:28:49Z
dc.date.available2023-06-13T09:11:11Z
dc.date.issued2022
dc.description.wosFundingTextThe authors would like to acknowledge the Brazilian research-funding agency CAPES for the support for developing this work. The authors thank imec ARF team in for having provided the samples studied in this work and Bertrand Parvais for your all suggestions in this paper.
dc.identifier.doi10.1109/LAEDC54796.2022.9908239
dc.identifier.eisbn978-1-6654-9767-1
dc.identifier.issnna
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41192
dc.publisherIEEE
dc.source.conferenceIEEE Latin American Electron Devices Conference (LAEDC)
dc.source.conferencedateJUL 04-06, 2022
dc.source.conferencelocationPuebla
dc.source.journalna
dc.source.numberofpages4
dc.title

Temperature Dependence of AlGaN/GaN High Electron Mobility Transistors on 200 mm Si wafers

dc.typeProceedings paper
dspace.entity.typePublication
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