Publication:
High temperature storage test of GaN-based HEMTs with Ni/TiW/Au gates
Date
| dc.contributor.author | Marcon, Denis | |
| dc.contributor.author | Viaene, John | |
| dc.contributor.author | Van Hove, Marleen | |
| dc.contributor.author | Stoffels, Steve | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.contributor.imecauthor | Marcon, Denis | |
| dc.contributor.imecauthor | Viaene, John | |
| dc.contributor.imecauthor | Stoffels, Steve | |
| dc.contributor.imecauthor | Decoutere, Stefaan | |
| dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
| dc.date.accessioned | 2021-10-20T13:12:18Z | |
| dc.date.available | 2021-10-20T13:12:18Z | |
| dc.date.issued | 2012 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21096 | |
| dc.source.conference | 6th Space Agency - MOD Workshop on Wide Bandgap Semiconductors and Components | |
| dc.source.conferencedate | 8/10/2012 | |
| dc.source.conferencelocation | Noordwijk The Netherlands | |
| dc.title | High temperature storage test of GaN-based HEMTs with Ni/TiW/Au gates | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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