Publication:

Scanning probe microscopy for atom probe tip shape monitoring

Date

2020
Meeting abstract
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45086.pdf 1.89 MB

Author(s)

Op de Beeck, Jonathan  
;
Fleischmann, Claudia  
;
Paredis, Kristof  
;
Vandervorst, Wilfried  

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Abstract

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1947 since deposited on 2021-10-29
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Acq. date: 2026-10-04

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