Publication:

BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic

Date

2012
Journal article
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dc.contributor.authorFranco, Jacopo
dc.contributor.authorGraziano, Salvatore
dc.contributor.authorKaczer, Ben
dc.contributor.authorCrupi, Felice
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorGrasser, Tibor
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.date.accessioned2021-10-20T11:02:51Z
dc.date.available2021-10-20T11:02:51Z
dc.date.issued2012
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20687
dc.source.beginpage1932
dc.source.endpage1935
dc.source.issue9_10
dc.source.journalMicroelectronics Reliability
dc.source.volume52
dc.title

BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic

dc.typeJournal article
dspace.entity.typePublication
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