Publication:

A High-Performance TID- and SEE-Tolerant ADC in 65 nm for Space Applications

Date

2026
Proceedings Paper
https://doi.org/10.1007/978-3-032-14405-8_2
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-0388-6498
cris.virtual.orcid0000-0002-4017-7033
cris.virtual.orcid0000-0002-1740-1711
cris.virtual.orcid0000-0002-7422-5793
cris.virtual.orcid0000-0002-5320-7844
cris.virtualsource.departmentc6a7c64f-cc6d-4073-a52e-4018ec595462
cris.virtualsource.department1e8df551-8fe0-41a7-88a2-dce01921eb1f
cris.virtualsource.departmentf00f253d-ca86-4aac-afa7-9f9514f86618
cris.virtualsource.departmentd76d2c3a-0b45-4361-a31c-0572bd6c5f3c
cris.virtualsource.department42898eaa-70e3-4759-9d66-6b3517f00a13
cris.virtualsource.orcidc6a7c64f-cc6d-4073-a52e-4018ec595462
cris.virtualsource.orcid1e8df551-8fe0-41a7-88a2-dce01921eb1f
cris.virtualsource.orcidf00f253d-ca86-4aac-afa7-9f9514f86618
cris.virtualsource.orcidd76d2c3a-0b45-4361-a31c-0572bd6c5f3c
cris.virtualsource.orcid42898eaa-70e3-4759-9d66-6b3517f00a13
dc.contributor.authorLi, Zheyi
dc.contributor.authorBerti, Laurent
dc.contributor.authorLin, Qiuyang
dc.contributor.authorZhao, Jinghao
dc.contributor.authorGorbunov, Maxim
dc.contributor.authorThys, Geert
dc.contributor.authorLeroux, Paul
dc.date.accessioned2026-09-03T10:10:54Z
dc.date.available2026-09-03T10:10:54Z
dc.date.createdwos2026
dc.date.issued2026
dc.description.abstractIn medical, aerospace, and high-energy physics applications, radiation tolerance in ADCs is crucial to guarantee the signal chain’s robustness. This paper presents a 13-bit pipelined-SAR ADC, which is designed by revealing and balancing the tradeoffs between power efficiency and radiation tolerance, achieving 80MS/s and 70.79-dB SNDR with high conversion efficiency and radiation tolerance.
dc.identifier.doi10.1007/978-3-032-14405-8_2
dc.identifier.isbn978-3-032-14407-2
dc.identifier.isbn978-3-032-14404-1
dc.identifier.issn1876-1100
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/60195
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherSPRINGER INTERNATIONAL PUBLISHING AG
dc.source.beginpage17
dc.source.conferenceAdvances in Analogue and Mixed-Signal Integrated Circuits for Space Applications, AMICSA
dc.source.conferencedate2025-06-16
dc.source.conferencelocationLisbon
dc.source.endpage24
dc.source.journalADVANCES IN ANALOGUE AND MIXED-SIGNAL INTEGRATED CIRCUITS FOR SPACE APPLICATIONS, AMICSA 2025
dc.source.numberofpages8
dc.title

A High-Performance TID- and SEE-Tolerant ADC in 65 nm for Space Applications

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2026-07-14
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-07-14
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