Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
The low-frequency noise behavior of pMOSFETs with embedded SiGe source/drain regions
Publication:
The low-frequency noise behavior of pMOSFETs with embedded SiGe source/drain regions
Copy permalink
Date
2007
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
14925.pdf
273.97 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Verheyen, Peter
;
Loo, Roger
;
Claeys, Cor
Journal
Abstract
Description
Metrics
Views
1799
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-16
Citations
Metrics
Views
1799
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-16
Citations