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The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability
Publication:
The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability
Date
2010-05
Proceedings Paper
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21432.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Grasser, Tibor
;
Reisinger, Hans
;
Wagner, Paul-Jurgen
;
Schanovsky, Franz
;
Goes, Wolfgang
;
Kaczer, Ben
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Abstract
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1925
since deposited on 2021-10-18
Acq. date: 2025-10-26
Citations
Metrics
Views
1925
since deposited on 2021-10-18
Acq. date: 2025-10-26
Citations