Publication:
Removal of photoresist by O3DI water processes: determination of degradation products
Date
| dc.contributor.author | Vankerckhoven, Hans | |
| dc.contributor.author | De Smedt, Frank | |
| dc.contributor.author | Vinckier, Chris | |
| dc.contributor.author | Van Herp, Bart | |
| dc.contributor.author | Claes, M. | |
| dc.contributor.author | De Gendt, Stefan | |
| dc.contributor.author | Heyns, Marc | |
| dc.contributor.imecauthor | De Gendt, Stefan | |
| dc.contributor.imecauthor | Heyns, Marc | |
| dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
| dc.date.accessioned | 2021-10-14T18:16:20Z | |
| dc.date.available | 2021-10-14T18:16:20Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5798 | |
| dc.source.conference | 200th Meeting of the Electrochemical Society: 7th International Symposium on Cleaning Technology in Semiconductor Device Manufac | |
| dc.source.conferencedate | 2/09/2001 | |
| dc.source.conferencelocation | San Francisco, CA USA | |
| dc.title | Removal of photoresist by O3DI water processes: determination of degradation products | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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