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Articles
High resolution structure imaging of octohedral void defects
Publication:
High resolution structure imaging of octohedral void defects
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Date
1997
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bender, Hugo
;
Vanhellemont, Jan
;
Schmolke, R.
Journal
Japanese Journal of Applied Physics. Part 2: Letters
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1896
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Acq. date: 2025-12-16
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Metrics
Views
1896
since deposited on 2021-09-30
2
last month
Acq. date: 2025-12-16
Citations