Publication:

Electrical properties of n-MOSFETs using the NiSi:Yb FUSI electrode

Date

2007-02
Journal article
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dc.contributor.authorYu, HongYu
dc.contributor.authorLauwers, Anne
dc.contributor.authorDemeurisse, Caroline
dc.contributor.authorRichard, Olivier
dc.contributor.authorMertens, Sofie
dc.contributor.authorOpsomer, Karl
dc.contributor.authorSinganamalla, Raghunath
dc.contributor.authorRosseel, Erik
dc.contributor.authorAbsil, Philippe
dc.contributor.authorBiesemans, Serge
dc.contributor.imecauthorLauwers, Anne
dc.contributor.imecauthorDemeurisse, Caroline
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorMertens, Sofie
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorRosseel, Erik
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecMertens, Sofie::0000-0002-1482-6730
dc.date.accessioned2021-10-16T21:55:05Z
dc.date.available2021-10-16T21:55:05Z
dc.date.issued2007-02
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13252
dc.source.beginpage154
dc.source.endpage156
dc.source.issue2
dc.source.journalIEEE Electron Device Letters
dc.source.volume28
dc.title

Electrical properties of n-MOSFETs using the NiSi:Yb FUSI electrode

dc.typeJournal article
dspace.entity.typePublication
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